At last week's EuMW, CST Computer Simulation Technology was previewing CST STUDIO SUITE 2010, the latest release of its integrated design environment, including an entirely new multi-physics product called CST MPHYSICS STUDIO. The flagship module CST MICROWAVE STUDIO (CST MWS) has also added an efficient algorithm that enables sensitivity analysis for several parameters in a single simulation run, and a range of new electromagnetic solver options, features and functionality.
The CST 'complete technology concept' offers different solution options within the same design environment, and now includes an asymptotic solver based on the Shooting Bouncing Ray method, an extension to physical optics.
The solver is capable of tackling simulations with an electrical size of many thousands of wavelengths, such as radar cross section analysis.
The frequency domain solver now includes third and mixed order elements for increased simulation efficiency and speed, and also features CST's new sensitivity analysis approach. Furthermore the integration of CST MICROSTRIPES into CST STUDIO SUITE allows access to features that are particularly suited to EMC simulations, such as compact models and Octree meshing, all within the familiar design environment.
The sensitivity analysis algorithm in CST MWS 2010 is capable of evaluating the s-parameter dependencies on various model parameters after a single 3D electromagnetic simulation run, which means that all further evaluations for different model parameter sets can be derived without restarting the full-wave simulation. The efficiency of this approach makes Monte-Carlo based yield analysis feasible even for complex three-dimensional structures, because the s-parameter results are now available without the need for additional effort or computational cost.
"The sensitivity of a device's performance to small parameter variations is a key concern in many design processes," stated Dr. Martin Timm, Director of Marketing, CST. "Traditional approaches require multiple 3D simulations to derive the various parameter dependencies. CST's new sensitivity analysis gives engineers a fast and efficient means of further minimizing design risk
For many applications however, the analysis required is not confined to an electromagnetic problem, particularly when dealing with high power applications. Both the temperature rise and resulting stress have to be considered in the design process since these may have major implications for the device's performance. CST MPHYSICS STUDIO extends the integrated workflow to include dielectric or conductive losses for thermal analysis, which in turn is one of the possible sources of mechanical stress. The resulting deformation can then be subjected to sensitivity analysis.
CST MPHYSICS STUDIO features a mechanical stress solver as well as a stationary and a transient thermal solver, both of which are capable of considering the bioheat equation. "Many of our customers have requested a tool that will help them estimate the impact heating has on the performance of their products," stated Dr. Peter Thoma, Managing Director, R&D, CST. "Typically geometry and results have to be exchanged between tools from different vendors. CST MPHYSICS STUDIO is streamlined to meet the requirements of EM design engineers within their design flow."
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